| Record ID | marc_loc_updates/v36.i10.records.utf8:22220329:1157 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v36.i10.records.utf8:22220329:1157?format=raw |
LEADER: 01157cam a2200313 a 4500
001 2004301904
003 DLC
005 20080310124836.0
008 040806s2004 maua 000 0 eng d
010 $a 2004301904
020 $a1402080913
020 $a1402080921 (eBook)
035 $a(OCoLC)ocm55731319
040 $aVYR$cVYR$dDLC
042 $alccopycat
050 00 $aTK7871.99.M44$bC45 2004
082 00 $a621.382/24$222
100 1 $aChen, Pinhong.
245 10 $aStatic crosstalk-noise analysis :$bfor deep sub-micron digital designs /$cby Pinhong Chen, Desmond A. Kirkpatrick, Kurt Keutzer.
260 $aNorwell, MA :$bKluwer Academic Publishers,$cc2004.
300 $axviii, 113 p. :$bill. ;$c24 cm.
500 $aIncludes bibliographic references.
650 0 $aMetal oxide semiconductors, Complementary.
650 0 $aCrosstalk.
650 0 $aElectronic noise.
700 1 $aKirkpatrick, Desmond A.
700 1 $aKeutzer, Kurt William,$d1955-
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0820/2004301904-d.html
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/enhancements/fy0820/2004301904-t.html