| Record ID | marc_loc_updates/v36.i10.records.utf8:24291991:1265 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v36.i10.records.utf8:24291991:1265?format=raw |
LEADER: 01265cam a22003253a 4500
001 2005935282
003 DLC
005 20080306085943.0
008 051006s2006 nyua b 001 0 eng d
010 $a 2005935282
020 $a0387297421
024 3 $a9780387297422
035 $a(CStRLIN)CUBGGLAD152077440-B
035 $a(CU)GLAD152077440
040 $aGSU$cGSU$dDLC
050 00 $aMLCM 2006/40496 (T)
100 1 $aLai, Chin-Diew.
245 10 $aStochastic ageing and dependence for reliability /$cChin-Diew Lai, Min Xie.
246 3 $aStochastic aging and dependence for reliability
260 $aNew York, NY :$bSpringer Science + Business Media,$cc2006.
300 $axx, 418 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references (p. [363]-408) and index.
650 0 $aReliability (Engineering)$xMathematical models.
650 0 $aProduct life cycle$xMathematical models.
650 0 $aSystem failures (Engineering)$xMathematical models.
650 0 $aStochastic analysis.
650 0 $aDependence (Statistics)
700 1 $aXie, Min.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0663/2005935282-d.html
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/enhancements/fy0813/2005935282-t.html