| Record ID | marc_loc_updates/v36.i10.records.utf8:8444101:1080 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v36.i10.records.utf8:8444101:1080?format=raw |
LEADER: 01080cam a2200265 a 4500
001 97008206
003 DLC
005 20080310131205.0
008 970307r19971997maua b 001 0 eng
010 $a 97008206
020 $a079239920X (acid-free paper)
040 $aDLC$cDLC$dDLC
050 00 $aTK7874$b.M862 1997
082 00 $a621.381/046$221
245 00 $aMulti-chip module test strategies /$cedited by Yervant Zorian.
260 $aBoston :$bKluwer,$cc1997.
300 $a166 p. :$bill. ;$c27 cm.
440 0 $aFrontiers in electronic testing
500 $a"Reprinted from a special issue of Journal of electronic testing: theory and applications, vol. 10, nos. 1 & 2, April 1997."
504 $aIncludes bibliographical references and index.
650 0 $aMultichip modules (Microelectronics)$xTesting.
700 1 $aZorian, Yervant.
730 0 $aJournal of electronic testing.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0821/97008206-d.html
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/enhancements/fy0821/97008206-t.html