| Record ID | marc_loc_updates/v36.i31.records.utf8:15229687:1069 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v36.i31.records.utf8:15229687:1069?format=raw |
LEADER: 01069nam a22003257a 4500
001 2008275080
003 DLC
005 20080730093047.0
008 080716s2008 si a 001 0 eng
010 $a 2008275080
015 $aGBA780129$2bnb
016 7 $a014052511$2Uk
020 $a9789812700766 (hbk.)
020 $a9812700765 (hbk.)
020 $a9789812705426 (pbk.)
020 $a9812705422 (pbk.)
035 $a(OCoLC)ocn173721197
040 $aUKM$cUKM$dBTCTA$dYDXCP$dBAKER$dOCLCG$dTXA$dCUS$dDLC
042 $alccopycat
050 00 $aTA418.9.N35$bN252 2008
082 04 $a620.5$222
245 00 $aNanofabrication :$bfundamentals and applications /$ceditor, Ampere A. Tseng.
260 $aSingapore ;$aHackensack, N.J. :$bWorld Scientific,$cc2008.
300 $aviii, 574 p. :$bill. (some col.) ;$c26 cm.
504 $aIncludes bibliographical references and index.
650 0 $aNanostructured materials.
650 0 $aNanostructures.
650 0 $aScanning probe microscopy.
650 0 $aLithography, Electron beam.
700 1 $aTseng, A. A.$q(Ampere A.)