| Record ID | marc_loc_updates/v36.i36.records.utf8:8942675:1100 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v36.i36.records.utf8:8942675:1100?format=raw |
LEADER: 01100nam a22002894a 4500
001 2007353897
003 DLC
005 20080903121226.0
008 061102s2006 fr a b 101 0 fre
010 $a 2007353897
020 $a2271064309
035 $a(FrPJT)JTL00190312
040 $aDLC$cDLC
041 0 $afre$feng
050 00 $aQC443$b.T43 2006
245 00 $aTechniques innovantes pour la caractérisation optique microstructurale de couches minces /$ccoordonné par André Ayral et Vincent Rouessac.
260 $aParis :$bCNRS,$cc2006.
300 $a181 p. :$bill. ;$c24 cm.
490 0 $aCollection "Sciences et techniques de l'ingénieur"
546 $aIn French with table of contents in English.
500 $aProceedings of a conference organized by Institut européene des membranes and held in Montpellier, April 5-6, 2005
504 $aIncludes bibliographical references and index.
650 0 $aEllipsometry$vCongresses.
650 0 $aReflectance spectroscopy$vCongresses.
650 0 $aThin films$vCongresses.
700 1 $aAyral, André,$d1960-
700 1 $aRouessac, Vincent.