| Record ID | marc_loc_updates/v36.i38.records.utf8:10610036:753 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v36.i38.records.utf8:10610036:753?format=raw |
LEADER: 00753cam a22002174a 4500
001 2007275774
003 DLC
005 20080918152950.0
008 070523s2007 mnua b 001 0 eng
010 $a 2007275774
040 $aDLC$cDLC$dDLC
050 00 $aBF39$b.R275 2007
082 00 $a150.1/5195$222
245 00 $aRasch measurement :$badvanced and specialized applications /$cEverett V. Smith, Jr., Richard M. Smith, editors.
260 $aMaple Grove, Minn. :$bJAM Press,$c2007.
300 $avii, 470 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and indexes.
650 0 $aRasch models.
700 1 $aSmith, Everett V.
700 1 $aSmith, Richard M.
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/fy0802/2007275774.html