| Record ID | marc_loc_updates/v38.i27.records.utf8:8406766:1257 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v38.i27.records.utf8:8406766:1257?format=raw |
LEADER: 01257cam a22002537a 4500
001 2008272117
003 DLC
005 20100701103736.0
008 080328s2007 dcu 000 0 eng d
010 $a 2008272117
020 $a0309111838
020 $a9780309111836
035 $a(OCoLC)ocn173485357
040 $aYDXCP$cYDXCP$dBAKER$dBTCTA$dIWA$dDLC
042 $alccopycat
050 00 $aTK415.E44$bA88 2007
082 00 $a338.97307$222
245 03 $aAn assessment of the National Institute of Standards and Technology Electronics and Electrical Engineering Laboratory :$bfiscal year 2007 /$cPanel on Electronics and Electrical Engineering, Laboratory Assessments Board, Division on Engineering and Physical Sciences, National Research Council of the National Academies.
260 $aWashington, D.C. :$bNational Academies Press,$cc2007.
300 $avi, 29 p. ;$c28 cm.
500 $aIssues for fiscal year 2009- are cataloged as a serial in LC.$5DLC
610 20 $aElectronics and Electrical Engineering Laboratory (National Institute of Standards and Technology)$xEvaluation.
710 2 $aNational Research Council (U.S.).$bPanel on Electronics and Electrical Engineering.
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/fy0804/2008272117.html