| Record ID | marc_loc_updates/v38.i37.records.utf8:16833031:1267 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v38.i37.records.utf8:16833031:1267?format=raw |
LEADER: 01267nam a22003257a 4500
001 2010286660
003 DLC
005 20100910100749.0
008 100330s2008 waua b 101 0 eng d
010 $a 2010286660
020 $a9780819472854 (pbk.)
020 $a0819472859 (pbk.)
035 $a(OCoLC)ocn268992375
040 $aSCW$cSCW$dDLC
042 $alccopycat
050 00 $aTA418.7$b.R43 2008
245 00 $aReflection, scattering, and diffraction from surfaces :$b11-12 August 2008, San Diego, California, USA /$cZu-Han Gu, Leonard M. Hanssen, editors ; sponsored and published by SPIE.
260 $aBellingham, Wash. :$bSPIE,$cc2008.
300 $a1 v. (various pagings) :$bill. ;$c28 cm.
490 1 $aProceedings of SPIE,$x0277-786X ;$vv. 7065
504 $aIncludes bibliographical references and author index.
650 0 $aSurface roughness$xMeasurement$vCongresses.
650 0 $aDiffractive scattering$vCongresses.
650 0 $aOptical measurements$vCongresses.
650 0 $aScattering (Physics)$vCongresses.
650 0 $aMetrology$vCongresses.
700 1 $aGu, Zu-Han.
700 1 $aHanssen, Leonard Matheus,$d1953-
710 2 $aSPIE (Society)
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 7065.