| Record ID | marc_loc_updates/v39.i46.records.utf8:8159205:1180 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v39.i46.records.utf8:8159205:1180?format=raw |
LEADER: 01180nam a22003377a 4500
001 2011293673
003 DLC
005 20111109090703.0
008 111108s2011 ncua b 001 0 eng
010 $a 2011293673
015 $aGBB058911$2bnb
016 7 $a015546329$2Uk
020 $a9781934356623 (pbk.)
020 $a193435662X (pbk.)
035 $a(OCoLC)ocn620364588
040 $aUKM$cUKM$dBTCTA$dYDXCP$dSINLB$dNUI$dZWZ$dDLC
042 $alccopycat
050 00 $aQA76.73.C15$bG75 2011
082 04 $a005.12$222
100 1 $aGrenning, James W.
245 10 $aTest-driven development for embedded C /$cJames W. Grenning.
260 $aRaleigh, N.C. :$bPragmatic Bookshelf,$cc2011.
300 $axxiv, 351 p. :$bill. ;$c23 cm.
504 $aIncludes bibliographical references (p. [343]-345) and index.
520 $aProvides information and code examples that focus on the use of TDD in embedded C programming.
650 0 $aApplication software$xDevelopment.
650 0 $aC (Computer program language)
630 07 $a(langage de programmation).$2ram
650 7 $aLogiciels.$2ram
650 7 $aLogiciels$xDéveloppement.$2ram
650 7 $aC (Computer language)$2sears