| Record ID | marc_loc_updates/v40.i04.records.utf8:14418218:1593 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v40.i04.records.utf8:14418218:1593?format=raw |
LEADER: 01593nam a22003257a 4500
001 2011294341
003 DLC
005 20120120141829.0
008 120119s2009 paua b 101 0 eng
010 $a 2011294341
020 $a9781605111285
020 $a1605111287
035 $a(OCoLC)ocn505804375
040 $aLHL$cLHL$dYDXCP$dVRC$dBTCTA$dDLC
042 $alccopycat
050 00 $aTK7871.99.M44$bC5725 2009
245 00 $aCMOS gate-stack scaling-- materials, interfaces and reliability implications :$bsymposium held April 14-16, 2009, San Francisco, california, U.S.A. /$ceditors, Alexander A. Demkov ... [et al.].
260 $aWarrendale, Pa. :$bMaterials Research Society,$cc2009.
300 $aviii, 179 p. :$bill. ;$c24 cm.
490 1 $aMRS proceedings ;$vv. 1155
500 $a" ... Symposium C, 'CMOS Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications,' held April 14-16 at the 2009 MRS Spring Meeting in San Francisco, California" -- preface.
504 $aIncludes bibliographical references and indexes.
650 0 $aMetal oxide semiconductors, Complementary$vCongresses.
650 0 $aMetal oxide semiconductors$xMaterials$vCongresses.
650 0 $aSilicides$vCongresses.
650 0 $aGate array circuits$vCongresses.
700 1 $aDemkov, Alexander A.
710 2 $aMaterials Research Society.$bMeeting$d(2009 :$cSan Francisco, Calif.)
711 2 $aSymposium C, "CMOS Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications"$d(2009 :$cSan Francisco, Calif.)
830 0 $aMaterials Research Society symposia proceedings$vv. 1155.