| Record ID | marc_loc_updates/v40.i08.records.utf8:21384282:1263 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v40.i08.records.utf8:21384282:1263?format=raw |
LEADER: 01263cam a22003137a 4500
001 2011906036
003 DLC
005 20120215120738.0
008 111205s2011 nyua b 101 0 eng d
010 $a 2011906036
020 $a9780735409255
020 $a0735409250
035 $a(OCoLC)ocn754745672
040 $aBTCTA$beng$cBTCTA$dGZN$dDLC
042 $alccopycat
050 00 $aQH212.X2$bI58 2010
111 2 $aInternational Conference on X-Ray Microscopy$n(10th :$d2010 :$cChicago, Ill.)
245 14 $aThe 10th International Conference on X-ray Microscopy, Chicago, Illinois, USA, 15-20 August 2010 /$ceditors, Ian McNulty, Catherine Eyberger, Barry Lai.
246 3 $aTenth International Conference on X-Ray Microscopy
260 $aMellville, N.Y.$bAmerican Institute of Physics,$c2011.
300 $axii, 473 p. :$bill. ;$c28 cm.
490 1 $aAIP conference proceedings,$x0094-243X ;$v1365.
504 $aIncludes bibliographical references and index.
650 0 $aX-ray microscopy$vCongresses.
700 1 $aMcNulty, Ian.
700 1 $aEyberger, Catherine E.
700 1 $aLai, Barry.
830 0 $aAIP conference proceedings ;$vno. 1365.$x0094-243X
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy1206/2011906036-d.html