| Record ID | marc_loc_updates/v40.i09.records.utf8:4985613:1652 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v40.i09.records.utf8:4985613:1652?format=raw |
LEADER: 01652cam a22003018a 4500
001 2010043713
003 DLC
005 20120223094548.0
008 101102s2010 flu b 001 0 eng
010 $a 2010043713
020 $a9781439821404 (hardback)
040 $aDLC$cDLC
042 $apcc
050 00 $aTK7895.E42$bP738 2010
082 00 $a004.16$222
084 $aCOM051230$aTEC008000$aTEC009000$2bisacsh
100 1 $aPries, Kim H.,$d1955-
245 10 $aTesting complex and embedded systems /$cKim H. Pries, Jon M. Quigley.
260 $aBoca Raton, FL :$bCRC Press,$c2010.
263 $a1012
300 $ap. cm.
520 $a"Using combinatorial approaches, this book aims to motivate testers and testing organizations to perform meaningful testing. The text details planning activities prior to testing, how to scope the work, and how to achieve a successful conclusion. Rather than presenting the entire continuum of testing for a particular product or design attribute, this volume focuses on boundary conditions. The authors provide various techniques that can be used to streamline testing and help identify problems before they occur, including turbocharge testing methods from Six Sigma. Coverage includes testing, simulation, and emulation"--$cProvided by publisher.
504 $aIncludes bibliographical references and index.
650 0 $aEmbedded computer systems$xTesting.
650 7 $aCOMPUTERS / Software Development & Engineering / General$2bisacsh.
650 7 $aTECHNOLOGY & ENGINEERING / Electronics / General$2bisacsh.
650 7 $aTECHNOLOGY & ENGINEERING / Engineering (General)$2bisacsh.
700 1 $aQuigley, Jon M.