| Record ID | marc_loc_updates/v40.i14.records.utf8:11767421:1060 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v40.i14.records.utf8:11767421:1060?format=raw |
LEADER: 01060nam a22003017a 4500
001 2011941622
003 DLC
005 20120402132424.0
008 111020s2012 nyua b 001 0 eng d
010 $a 2011941622
020 $a9781461418115 (alk. paper)
020 $a1461418119 (alk. paper)
020 $a9781461418122 (e-ISBN)
035 $a(OCoLC)ocn776675131
040 $aCAI$cCAI$dIXA$dDLC
042 $alccopycat
050 00 $aTK7874$b.H3945 2012
082 04 $a621.381$223
100 1 $aHe, Ming.
245 10 $aMetal-dielectric interfaces in gigascale electronics :$bthermal and electrical stability /$cMing He, Toh-Ming Lu.
260 $aNew York :$bSpringer,$cc2012.
300 $axi, 149 p. :$bill. (some col.) ;$c24 cm.
490 1 $aSpringer series in materials science,$x0933-033X ;$vv. 157
504 $aIncludes bibliographical references and index.
650 0 $aMicroelectronics$xMaterials.
650 0 $aInterfaces (Physical sciences)
700 1 $aLu, T.-M.$q(Toh-Ming),$d1943-
830 0 $aSpringer series in materials science ;$vv. 157.