MARC Record from Miami University of Ohio

LEADER: 01562nam 2200385Ia 4500
001 ocm27869110
005 19930418130938.0
007 he-bmb024bbca
008 930407s1991 mdua bbt f000 0 eng d
040 $aGPO$cGPO
043 $an-us---
049 $aMIB*
074 $a0249-A (MF)
086 0 $aC 13.46:1289
086 0 $aC 13.46:1289
100 1 $aWagner, C. D.$q(Charles Daniel),$d1917-
245 14 $aThe NIST X-ray photoelectron spectroscopy (XPS) database$h[microform] /$cCharles D. Wagner
260 $aGaithersburg, MD :$bU.S. Dept. of Commerce, National Institute of Standards and Technology,$c1991
300 $aiii, 65 p. :$bill. ;$c28 cm
490 1 $aNIST technical note ;$v1289
500 $aPaper version no longer for sale by the Supt. of Docs
500 $aDistributed to depository libraries in microfiche
500 $aShipping list no.: 92-2029-M
500 $a"October 1991."
504 $aIncludes bibliographical references
513 $aFinal
533 $aMicrofiche.$b[Washington, D.C.?] :$cSupt. of Docs., U.S. G.P.O.,$d[1992]$e1 microfiche : negative
610 20 $aNational Institute of Standards and Technology (U.S.)$xDatabases
650 0 $aX-ray spectroscopy$xDatabases
650 0 $aPhotoelectron spectroscopy$xDatabases
710 20 $aNational Institute of Standards and Technology (U.S.)
830 0 $aNIST technical note ;$v1289
907 $a.b18086548$b03-30-00$c05-25-93
998 $adoc$b11-20-94$cm$da$e-$feng$gmdu$h4$i1
945 $g1$j0$ldocsf$nrecd$o-$p$0.00$sf$t21$u0$v0$w0$x0$y.i20606412$z06-09-93