MARC Record from Miami University of Ohio

LEADER: 01375cam 2200325Ia 4500
001 ocm30056911
005 19940515143810.0
008 940330s1989 dcua bt f000 0 eng d
040 $aGPO$cGPO
049 $aMIB*
074 $a0247-D (MF)
086 0 $aC 13.58:89-3917
086 0 $aC 13.58:89-3917
100 1 $aRasmussen, A. L
245 10 $aImproved low-level silicon-avalanche-photodiode transfer standards at 1.064 micrometers /$cA.L. Rasmussen, P.A. Simpson, A.A. Sanders
260 $a[Washington, D.C.] :$bU.S. Dept. of Commerce, National Institute of Standards and Technology ;$a[Springfield, VA :$bOrder from National Technical Information Service,$c1989]
300 $aiii, 36 p. :$bill. ;$c28 cm
490 1 $aNISTIR ;$v89-3917
500 $aDistributed to depository libraries in microfiche
500 $a"August 1989."
504 $aIncludes bibliographical references (p. 14)
650 0 $aLaser pulses, Ultrashort
700 10 $aSimpson, Philip A
700 10 $aSanders, A. A
710 20 $aNational Institute of Standards and Technology (U.S.)
740 01 $aImproved low level silicon avalanche photodiode transfer standards at 1.064 micrometers
830 0 $aNISTIR ;$v3917
907 $a.b22054649$b04-24-95$c12-02-94
998 $adoc$b12-02-94$cm$da$e-$feng$gdcu$h0$i1
945 $g1$j0$ldocsf$nrecd$o-$p$0.00$sf$t21$u0$v0$w0$x0$y.i2679861x$z04-24-95