MARC Record from Miami University of Ohio

LEADER: 01550nam 2200397Ia 4500
001 ocm37996564
002 90182126
005 19971124091039.0
007 heubmb024bbca
008 971124s1996 mdua bb f000 0 eng d
040 $aGPO$cGPO
043 $an-us---
049 $aMIB*
074 $a0249-A (MF)
086 0 $aC 13.46:1417
086 0 $aC 13.46:1417
100 1 $aChang, Y. May
245 10 $aNIST measurement assurance program for capacitance standards at 1 kHz$h[microform] /$cY. May Chang
260 $aGaithersburg, MD :$bU.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,$c1996
300 $aiv, 19 p. :$bill. ;$c28 cm
440 0 $aNIST technical note ;$v1417
500 $aDistributed to depository libraries in microfiche
500 $aShipping list no.: 98-0003-M
500 $aPaper version no longer available for sale by the Supt. of Docs
500 $a"March 1996."
504 $aIncludes bibliographical references (p. 10)
533 $aMicrofiche.$b[Washington, D.C.] :$cSupt. of Docs., U.S. G.P.O.,$d[1997]$e1 microfiche : negative
590 $a[cat:grl]
650 0 $aCapacitance meters$xCalibration
650 0 $aElectric capacity$xStandards$zUnited States
710 2 $aNational Institute of Standards and Technology (U.S.)
907 $a.b24485366$b02-16-98$c11-25-97
998 $adoc$b01-30-98$cm$da$e-$feng$gmdu$h0$i1
996 $a98-0003-M
997 $a10/27/97
945 $g1$j0$ldocsf$nrecd$o-$p$0.00$q $r $sf$t21$u0$v0$w0$x0$y.i30635639$z11-25-97