MARC Record from Miami University of Ohio

LEADER: 01608nam 2200373 a 4500
001 ocm40137328
002 tmp97217868
005 19981020094141.0
007 heubmb024bbca
008 981020s1998 mdua bb f000 0 eng d
040 $aGPO$cGPO$dDLC$dMvI
049 $aMIB*
074 $a0247 (MF)
086 0 $aC 13.10:250-43
086 0 $aC 13.10:250-43
100 1 $aGibson, Charles E
245 10 $aRadiance temperature calibrations$h[microform] /$cCharles E. Gibson, Benjamin K. Tsai, and Albert C. Parr
260 $aGaithersburg, MD :$bU.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ;$aWashington, DC :$bFor sale by the Supt. of Docs., U.S. G.P.O.,$c1998
300 $aviii, 56, [60] p. :$bill. ;$c28 cm
490 1 $aNIST special publication ;$v250-43.$aNIST measurement services
500 $aShipping list no.: 98-0866-M
500 $a"January 1998."
504 $aIncludes bibliographical references (p. 55-56)
533 $aMicrofiche.$b[Washington, D.C.] :$cSupt. of Docs., U.S. G.P.O.,$d[1998]$e2 microfiches : negative
650 0 $aBrightness temperature
650 0 $aPyrometers$xCalibration
700 1 $aTsai, Benjamin K
700 1 $aParr, A. C.$q(Albert C.)
710 2 $aNational Institute of Standards and Technology (U.S.)
830 0 $aNIST special publication ;$v250-43
830 0 $aNIST special publication.$pNIST measurement services
907 $a.b26289155$b12-02-98$c08-14-98
998 $adoc$b12-02-98$cm$da$e-$feng$gmdu$h0$i1
945 $g1$j0$ldocsf$nrecd$o-$p$0.00$q $r $sf$t21$u0$v0$w0$x0$y.i33330323$z08-14-98