| Record ID | marc_miami_univ_ohio/allbibs0130.out:9870916:1096 |
| Source | Miami University of Ohio |
| Download Link | /show-records/marc_miami_univ_ohio/allbibs0130.out:9870916:1096?format=raw |
LEADER: 01096nam 2200277Ia 4500
001 ocm43794228
005 20000407140356.0
008 000406s1999 iaua b 000 0 eng d
040 $aSDB$cSDB$dMIA
049 $aMIAA
090 $aLB3060.32.C65$bC43 1999
100 1 $aChen, Shu-Ying
245 10 $aExploring the relationship between item exposure rate and test overlap rate in computerized adaptive testing /$cShu-Ying Chen, Robert D. Ankenmann, Judith A. Spray
260 $aIowa City, Iowa :$bACT, Inc.,$cc1999
300 $a27 p. :$bill. ;$c28 cm
440 0 $aACT research report series ;$v99-5
500 $a"September 1999"--Cover
504 $aIncludes bibliographical references (p. 17-18)
650 0 $aComputer adaptive testing
650 0 $aExaminations$xDesign and construction
700 1 $aAnkenmann, Robert D
700 1 $aSpray, Judith A
710 2 $aAmerican College Testing Program
907 $a.b27636264$b04-07-00$c03-30-00
998 $akngl$b04-07-00$cm$da$e-$feng$giau$h0$i1
945 $g1$i35054023488071$j0$lkngli$o $p$0.00$q $r $s-$t0$u4$v2$w0$x0$y.i35865362$z03-30-00