| Record ID | marc_miami_univ_ohio/allbibs0140.out:4079902:1494 |
| Source | Miami University of Ohio |
| Download Link | /show-records/marc_miami_univ_ohio/allbibs0140.out:4079902:1494?format=raw |
LEADER: 01494nam 2200361 a 4500
001 ocm48886124
002 tmp97196721
005 20020129100515.0
007 he bmb024bbca
008 020129s2000 mdu btb f000 0 eng d
040 $aGPO$cGPO$dDLC$dMvI
049 $aMIB*
074 $a0247 (MF)
086 0 $aC 13.10:500-244
086 0 $aC 13.10:500-244
100 1 $aKacker, Raghu
245 13 $aAn interpretation of the Guide to the expression of uncertainty in measurement$h[microform] /$cRaghu Kacker
260 $aGaithersburg, MD :$bU.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ;$aWashington, DC :$bFor Sale by the Supt. of Docs., U.S. G.P.O.,$c[2000]
300 $a16 p. ;$c28 cm
440 0 $aNIST special publication ;$v500-244
490 1 $aInformation technology
500 $a"May 2000."
500 $aShipping list no.: 2002-0120-M
504 $aIncludes bibliographical references (p. 15)
533 $aMicrofiche.$b[Washington, D.C.] :$cSupt. of Docs., U.S. G.P.O.,$d2002$e1 microfiche : negative
650 0 $aUncertainty (Information theory)
650 0 $aMeasurement
650 0 $aProbabilities
710 2 $aNational Institute of Standards and Technology (U.S.)
830 0 $aNIST special publication.$pInformation technology
907 $a.b29226764$b06-28-07$c02-01-02
998 $adoc$b03-07-02$cm$da$e-$feng$gmdu$h3$i1
945 $g1$j0$ldocsf$nrecd$o-$p$0.00$q $r $sf$t21$u0$v0$w0$x0$y.i38239310$z02-01-02