| Record ID | marc_oregon_summit_records/catalog_files/osu_bibs.mrc:1128356823:954 |
| Source | Oregon Libraries |
| Download Link | /show-records/marc_oregon_summit_records/catalog_files/osu_bibs.mrc:1128356823:954?format=raw |
LEADER: 00954nam a2200301Ia 4500
001 39967212
003 OR
008 980930s1998 xx a b 000 0 eng d
035 $a11063551
040 $aORE$cORE
049 $aOREV
090 $aLD4330 1998$b.I5
090 $aLD4330 1998$b.I5
100 1 $aIndermuehle, Scott W.
245 10 $aThermal characterization technique for thin dielectric films /$cby Scott W. Indermuehle.
260 $cc1998.
300 $a92 leaves, bound :$bill. ;$c29 cm.
500 $aTypescript (photocopy)
502 $aThesis (M.S.)--Oregon State University, 1998.
504 $aIncludes bibliographical references (leaves 90-92).
650 0 $aDielectric films$xThermal properties.
690 $aTheses, OSU$xMechanical Engineering.
907 $a.b19644048$bmulti$c-
902 $a050902
998 $b2$c981001$dm$ea$f-$g0
999 $a19980930100403.0
945 $lvge $d120008100113$e1
945 $ltsvn $d120008100238$e2