| Record ID | marc_oregon_summit_records/catalog_files/osu_bibs.mrc:1456527165:993 |
| Source | Oregon Libraries |
| Download Link | /show-records/marc_oregon_summit_records/catalog_files/osu_bibs.mrc:1456527165:993?format=raw |
LEADER: 00993cam a22003254a 4500
001 50002266
003 OCoLC
005 20040302172517.0
008 020529s2002 gw a b 001 0 eng
010 $a2002070720
020 $a3540437649 (alk. paper)
040 $aDLC$cDLC$dORE
042 $apcc
049 $aOREU
050 00 $aTA417.23$b.F85 2002
050 00 $aTA417.23$b.F85 2002
100 1 $aFultz, B.$q(Brent)
245 10 $aTransmission electron microscopy and diffractometry of materials /$cBrent Fultz, James Howe.
250 $a2nd ed.
260 $aBerlin ;$aNew York :$bSpringer,$cc2002.
300 $axxi, 748 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aMaterials$xMicroscopy.
650 0 $aTransmission electron microscopy.
650 0 $aX-ray diffractometer.
700 1 $aHowe, James M.,$d1955-
907 $a.b23135177$bvge $c-
902 $a080127
998 $b1$c040302$dm$ea$f-$g0
945 $lvge $d120141695177$e1