| Record ID | marc_records_scriblio_net/part08.dat:32726187:819 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part08.dat:32726187:819?format=raw |
LEADER: 00819cam 2200229 i 4500
001 74034162 //r922
003 DLC
005 19920618144314.7
008 750102s1975 nyua b 00110 eng
010 $a 74034162 //r922
020 $a0306308207
040 $aDLC$cDLC$dDLC
050 00 $aQH212.S3$bG64
082 00 $a502/.8
100 10 $aGoldstein, Joseph,$d1939-
245 10 $aPractical scanning electron microscopy :$belectron and ion microprobe analysis /$cedited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Everhart.
260 0 $aNew York :$bPlenum Press,$c[1975]
300 $axviii, 582 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aScanning electron microscopy.
650 0 $aMicroprobe analysis.
700 10 $aYakowitz, Harvey,$d1939-$ejoint author.