| Record ID | marc_records_scriblio_net/part09.dat:79202112:925 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part09.dat:79202112:925?format=raw |
LEADER: 00925cam 2200241 i 4500
001 76005868
003 DLC
005 19990716000000.0
008 760227s1976 dcua f000 0 eng
010 $a 76005868
040 $aDLC$cDLC$dDLC
050 00 $aQC100$b.U57 no. 400-7$aTK7871.89
082 00 $a602/.1 s$a621.3815/22
086 0 $aC 13.10:400-7
100 1 $aKenney, James M.
245 10 $aSemiconductor measurement technology :$bpermanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes /$cJames M. Kenney.
260 $aWashington :$bU.S. Dept. of Commerce, National Bureau of Standards,$c1976.
300 $a26 p. :$bill. ;$c27 cm.
490 1 $aNBS special publication ; 400-7
650 0 $aDiodes, Schottky-barrier$xEffect of radiation on.
650 0 $aMixing circuits.
650 0 $aMicrowave measurements.
830 0 $aNBS special publication ;$v400-7.