| Record ID | marc_records_scriblio_net/part10.dat:131432497:1027 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part10.dat:131432497:1027?format=raw |
LEADER: 01027cam 2200277 i 4500
001 77608178
003 DLC
005 19990716000000.0
008 770817s1977 dcua b f000 0 eng
010 $a 77608178
040 $aDLC$cDLC$dDLC
050 00 $aQC100$b.U57 no. 400-40$aTK7871.85
082 00 $a602/.1 s$a621.3815/2/028
086 0 $aC 13.10:400-40
100 1 $aGoodman, Alvin M.
245 12 $aA 25-kV bias-isolation unit for 1-MHz capacitance and conductance measurements /$cAlvin M. Goodman.
260 $aWashington :$bU.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,$c1977.
300 $avii, 49 p. :$bill. ;$c26 cm.
440 0 $aSemiconductor measurement technology
490 1 $aNBS special publication ; 400-40
504 $aIncludes bibliographical references.
650 0 $aSemiconductors$xTesting.
650 0 $aElectric capacity.
650 0 $aElectric conductivity.
650 0 $aElectric meters.
830 0 $aNBS special publication ;$v400-40.