| Record ID | marc_records_scriblio_net/part11.dat:103368026:960 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part11.dat:103368026:960?format=raw |
LEADER: 00960cam 2200253 i 4500
001 79009984
003 DLC
005 19990716000000.0
008 790307s1979 dcua f000 0 eng
010 $a 79009984
040 $aDLC$cDLC$dDLC
050 00 $aQC100$b.U57 no. 400-14$aTK7871.92
082 00 $a602/.1 s$a621.3815/2
086 0 $aC 13.10:400-14.
100 1 $aRubin, Sherwin.
245 10 $aThermal resistance measurements on power transistors /$cSherwin Rubin and Frank F. Oettinger.
260 $aWashington :$bU.S. Dept. of Commerce, National Bureau of Standards : for sale by Supt. of Docs., U.S. Govt. Print. Off.,$c1979.
300 $avi, 62 p. :$bill. ;$c26 cm.
440 0 $aSemiconductor measurement technology
490 1 $aNBS special publication ; 400-14
650 0 $aPower transistors$xThermal properties.
650 0 $aSemiconductors$xJunctions.
700 1 $aOettinger, Frank F.,$ejoint author.
830 0 $aNBS special publication ;$v400-14.