| Record ID | marc_records_scriblio_net/part12.dat:170836624:651 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part12.dat:170836624:651?format=raw |
LEADER: 00651cam 2200205 i 4500
001 80607032
003 DLC
005 19851011000000.0
008 800207s1981 nyuaf b 00110 eng
010 $a 80607032
020 $a0442232861
050 0 $aQD98.E4$bH44
082 $a543/.0812
100 10 $aHeinrich, Kurt F. J.
245 10 $aElectron beam x-ray microanalysis /$cKurt F. J. Heinrich.
260 0 $aNew York :$bVan Nostrand Reinhold Co.,$cc1981.
300 $axxiii, 578 p., [4] leaves of plates :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and indexes.
650 0 $aElectron probe microanalysis.
650 0 $aX-ray spectroscopy.