| Record ID | marc_records_scriblio_net/part14.dat:233582975:1408 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part14.dat:233582975:1408?format=raw |
LEADER: 01408cam 22003377a 4500
001 2003535276
003 DLC
005 20030606111303.0
008 030423s2002 waua b 101 0 eng
010 $a 2003535276
035 $a(OCoLC)ocm51110642
040 $aLHL$cLHL$dDLC
042 $alccopycat
020 $a0819445479
050 00 $aTA418.7$b.S929 2002
082 00 $a620/.44$221
245 00 $aSurface scattering and diffraction for advanced metrology II :$b9 July, 2002, Seattle, Washington, USA /$cZu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, the Boeing Company ... [et al.].
260 $aBellingham, Washington :$bSPIE,$cc2002.
300 $avii, 186 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series ;$vv. 4780
504 $aIncludes bibliographic references and author index.
650 0 $aSurface roughness$xMeasurement$vCongresses.
650 0 $aDiffractive scattering$vCongresses.
650 0 $aOptical measurements$vCongresses.
650 0 $aScattering (Physics)$vCongresses.
650 0 $aMetrology$vCongresses.
700 1 $aGu, Zu-Han.
700 1 $aMaradudin, A. A.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
710 2 $aBoeing Company.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 4780.