| Record ID | marc_records_scriblio_net/part14.dat:47875943:1288 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part14.dat:47875943:1288?format=raw |
LEADER: 01288cam 22003257a 4500
001 2002265497
003 DLC
005 20020907153424.0
008 020125s2001 waua b 101 0 eng
010 $a 2002265497
035 $a(OCoLC)ocm48545937
040 $aCUS$cCUS$dDLC
042 $alccopycat
020 $a0819441619
050 00 $aTA418.7$b.S928 2001
082 00 $a681/.25$221
245 00 $aSurface scattering and diffraction for advanced metrology :$b1 August 2001, San Diego, USA /$cZu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash., USA :$bSPIE,$cc2001.
300 $avii, 164 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series ;$vv. 4447
504 $aIncludes bibliographical references and index.
650 0 $aSurface roughness$xMeasurement$vCongresses.
650 0 $aDiffractive scattering$vCongresses.
650 0 $aOptical measurements$vCongresses.
650 0 $aScattering (Physics)$vCongresses.
650 0 $aMetrology$vCongresses.
700 1 $aGu, Zu-Han.
700 1 $aMaradudin, A. A.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 4447.