| Record ID | marc_records_scriblio_net/part17.dat:60640865:1346 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part17.dat:60640865:1346?format=raw |
LEADER: 01346pam 2200289 a 4500
001 84018100
003 DLC
005 19990716000000.0
008 840904s1984 nyua b 101 0 eng
010 $a 84018100
020 $a030641838X
040 $aDLC$cDLC$dDLC
050 00 $aTA417.25$b.F73 1983
082 00 $a620.1/1272$219
111 2 $aFrance-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science$d(1983 :$cSnowmass Village, Colo.)
245 10 $aApplications of x-ray topographic methods to materials science /$cedited by Sigmund Weissmann, Françoise Balibar, and Jean-François Petroff.
260 $aNew York :$bPlenum Press,$cc1984.
300 $axiii, 536 p. :$bill. ;$c26 cm.
500 $a"Based on the proceedings of the France-U.S.A. Seminar on Application of X-Ray Topographic Methods to Materials Science, held August 7-10, 1983, in Snowmass Village, Colorado, which was sponsored jointly by CNRS and NSF"--T.p. verso.
504 $aIncludes bibliographies and index.
650 0 $aRadiography, Industrial$xCongresses.
650 0 $aX-rays$xIndustrial applications$xCongresses.
700 1 $aWeissmann, Sigmund.
700 1 $aBalibar, Françoise.
700 1 $aPetroff, Jean-François.
710 2 $aCentre national de la recherche scientifique (France)
710 2 $aNational Science Foundation (U.S.)