| Record ID | marc_records_scriblio_net/part20.dat:24945461:944 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part20.dat:24945461:944?format=raw |
LEADER: 00944pam 2200253 a 4500
001 88038479
003 DLC
005 19900403163533.7
008 881125s1989 enkaf b 00100 eng
010 $a 88038479
020 $a019855625X :$c$67.50
040 $aDLC$cDLC$dDLC
050 00 $aQD96.S43$bS4 1989
082 00 $a543/.0873$219
245 00 $aSecondary ion mass spectrometry :$bprinciples and applications /$cedited by John C. Vickerman, Alan Brown, and Nicola M. Reed.
260 0 $aOxford :$bClarendon Press ;$aOxford ;$aNew York :$bOxford University Press,$c1989.
300 $axii, 341 p., [4] p. of plates :$bill. (some col.) ;$c24 cm.
440 4 $aThe International series of monographs on chemistry ;$v17
440 0 $aOxford science publications
504 $aIncludes bibliographical references.
650 0 $aSecondary ion mass spectrometry.
700 10 $aVickerman, J. C.
700 10 $aBrown, A. Alan.
700 10 $aReed, Nicola M.