| Record ID | marc_records_scriblio_net/part21.dat:70242634:855 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part21.dat:70242634:855?format=raw |
LEADER: 00855cam 2200241 a 4500
001 90021467 //r943
003 DLC
005 19940217135637.0
008 901023s1991 nyua b 00110 eng
010 $a 90021467 //r943
020 $a0195062701 (alk. paper)
040 $aDLC$cDLC$dDLC
050 00 $aQH212.S32$bS27 1991
082 00 $a502/.8/2$220
100 10 $aSarid, Dror.
245 10 $aScanning force microscopy :$bwith applications to electric, magnetic, and atomic forces /$cDror Sarid.
260 0 $aNew York :$bOxford University Press,$c1991.
300 $axi, 253 p. :$bill. ;$c25 cm.
490 1 $aOxford series on optical sciences ;$v2
504 $aIncludes bibliographical references (p. 231-249) and index.
650 0 $aScanning force microscopy.
650 0 $aSurfaces (Physics)
830 0 $aOxford series in optical and imaging sciences ;$v2.