| Record ID | marc_records_scriblio_net/part21.dat:85317610:1165 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part21.dat:85317610:1165?format=raw |
LEADER: 01165pam 2200289 a 4500
001 90041466
003 DLC
005 20040121100835.0
008 900626s1990 paua b 101 0 eng
010 $a 90041466
020 $a1558990720
040 $aDLC$cDLC$dDLC
050 00 $aTA417.23$b.H53 1990
082 00 $a620.1/1299$220
245 00 $aHigh resolution electron microscopy of defects in materials :$bsymposium held April 16-18, 1990, San Francisco, California, U.S.A. /$ceditors, Robert Sinclair, David J. Smith, Ulrich Dahmen.
260 $aPittsburgh, Pa. :$bMaterials Research Society,$cc1990.
300 $axi, 391 p. :$bill. ;$c24 cm.
490 1 $aMaterials Research Society symposium proceedings,$x0272-9172 ;$vv. 183
504 $aIncludes bibliographical references and indexes.
650 0 $aMaterials$xMicroscopy$vCongresses.
650 0 $aMaterials$xDefects$vCongresses.
650 0 $aHigh resolution electron microscopy$vCongresses.
700 1 $aSinclair, Robert.
700 1 $aSmith, David J.,$d1948-
700 1 $aDahmen, Ulrich.
710 2 $aMaterials Research Society.
830 0 $aMaterials Research Society symposia proceedings ;$vv. 183