| Record ID | marc_records_scriblio_net/part22.dat:193283470:1607 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part22.dat:193283470:1607?format=raw |
LEADER: 01607nam 2200325 a 4500
001 92085053
003 DLC
005 19930721110710.2
008 930416s1993 waua b 101 0 eng
010 $a 92085053
020 $a0819409103
040 $aDLC$cDLC
050 00 $aQC673$b.N4 1993
082 00 $a539.7/212$220
245 00 $aNeutrons, x-rays, and gamma rays :$bimaging detectors, material characterization techniques, and applications, 21-22 July 1992, San Diego, California /$cJohn Carpenter ...[et al.], chairs/editors.
260 $aBellingham, WA :$bSPIE,$cc1993.
300 $a369 p. :$bill. ;$c28 cm.
490 1 $aProceedings / SPIE--the International Society of Optical Engineering ;$vv. 1737
500 $aSponsored and published by SPIE--the International Society for Optical Engineering; cosponsoreing organization, Aviation Security R&D Service, FAA Technical Center.
504 $aIncludes bibliographical references and index.
650 0 $aElectrooptics$xCongresses.
650 0 $aNuclear counters$xCongresses.
650 0 $aNeutrons$xIndustrial applications$xCongresses.
650 0 $aX-rays$xIndustrial applications$xCongresses.
650 0 $aGamma rays$xIndustrial applications$xCongresses.
650 0 $aImaging systems$xIndustrial applications$xCongresses.
700 10 $aCarpenter, John M.
710 20 $aSociety of Photo-Optical Instrumentation Engineers.
710 20 $aFederal Aviation Administration Technical Center (U.S.).$bAviation Security Research & Development Service.
830 0 $aProceedings of SPIE--the International Society of Optical Engineering ;$vv. 1737.