| Record ID | marc_records_scriblio_net/part24.dat:57201026:736 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part24.dat:57201026:736?format=raw |
LEADER: 00736cam 2200229 a 4500
001 94021066
003 DLC
005 19950710083358.4
008 940602s1995 maua b 001 0 eng
010 $a 94021066
020 $a0890067260
040 $aDLC$cDLC$dDLC
050 00 $aTK7871.99.M44$bR35 1995
082 00 $a621.39/5/0287$220
100 1 $aRajsuman, Rochit.
245 10 $aIddq testing for CMOS VLSI /$cRochit Rajsuman.
260 $aBoston :$bArtech House,$cc1995.
300 $axii, 193 p.:$bill.;$c24 cm.
440 0 $aThe Artech House optoelectronics library.
504 $aIncludes bibliographical references(p.181-185) and index.
650 0 $aIddq testing.
650 0 $aIntegrated circuits$xVery large scale integration$xTesting.