| Record ID | marc_records_scriblio_net/part26.dat:120980137:1117 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part26.dat:120980137:1117?format=raw |
LEADER: 01117cam 2200277 a 4500
001 97011255
003 DLC
005 20030910193833.0
008 970304s1998 enka b 001 0 eng
010 $a 97011255
020 $a0471974013
040 $aDLC$cDLC$dDLC
041 $aeng$hger
050 00 $aTK7871.852$b.B43 1997
082 00 $a621.3815$221
100 1 $aBeck, Friedrich.
240 10 $aPräparationstechniken für die Fehleranalyse an integrierten Halbleiterschaltungen.$lEnglish
245 10 $aIntegrated circuit failure analysis :$ba guide to preparation techniques /$cFriedrich Beck ; translated by Stephen S. Wilson.
260 $aChichester ;$aNew York :$bWiley,$cc1998.
300 $axiv, 173 p. :$bill. ;$c24 cm.
440 0 $aWiley series in quality and reliability engineering
504 $aIncludes bibliographical references and index.
650 0 $aSemiconductors$xFailures.
650 0 $aSemiconductors$xTesting.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/description/wiley032/97011255.html
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/wiley022/97011255.html