| Record ID | marc_records_scriblio_net/part26.dat:125755840:938 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part26.dat:125755840:938?format=raw |
LEADER: 00938cam 2200265 a 4500
001 97016861
003 DLC
005 19970909120249.6
008 970421s1997 maua b 001 0 eng
010 $a 97016861
020 $a0792399455 (acid-free paper)
040 $aDLC$cDLC$dDLC
050 00 $aTK7871.99.M44$bC4 1997
082 00 $a621.39/5/0287$221
100 1 $aChakravarty, Sreejit.
245 10 $aIntroduction to ID̳D̳Q̳ testing /$cby Sreejit Chakravarty and Paul J. Thadikaran.
260 $aBoston :$bKluwer Academic Publishers,$cc1997.
300 $axvii, 322 p. :$bill. ;$c25 cm.
440 0 $aFrontiers in electronic testing
500 $aOn t.p. "D̳D̳Q̳" is subscript.
504 $aIncludes bibliographical references (p. 287-315) and index.
650 0 $aIddq testing.
650 0 $aDigital integrated circuits$xTesting.
650 0 $aIntegrated circuits$xVery large scale integration$xTesting.
700 1 $aThadikaran, Paul J.