| Record ID | marc_records_scriblio_net/part26.dat:163497527:1222 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part26.dat:163497527:1222?format=raw |
LEADER: 01222cam 2200301 a 4500
001 97080378
003 DLC
005 20000103121410.0
008 970916s1998 njua b 100 0 eng d
010 $a 97080378
020 $a0780343387 (softbound)
020 $a0780343395 (microfiche)
035 $a(OCoLC)40383319
040 $aMoKL$cMoKL$dOCoLC$dDLC
042 $alccopycat
050 04 $aTK7871.85$b.I5844 1998
082 00 $a621.3815/2$221
111 2 $aInternational Workshop on Statistical Metrology$n(3rd :$d1998 :$cHonolulu, Hawaii)
245 10 $aIWSM :$b1998 3rd International Workshop on Statistical Metrology : June 7, 1998, Honolulu /$c[sponsored by] IEEE Electron Devices Society.
246 3 $aWorkshop on statistical metrology
246 3 $aStatistical metrology
260 $aPiscataway, New Jersey :$bIEEE ;$aGaithersburg, Maryland :$bWiderkehr and Associates,$cc1998.
300 $avi, 121 p. :$bill. ;$c28 cm.
500 $a"IEEE Catalog Number 98EX113"--verso of T.p.
504 $aIncludes bibliographical references.
650 0 $aSemiconductors$xCharacterization$xStatistical methods$vCongresses.
650 0 $aSemiconductors$xMeasurement$vCongresses.
710 2 $aIEEE Electron Devices Society.