| Record ID | marc_records_scriblio_net/part28.dat:54457670:1176 |
| Source | Scriblio |
| Download Link | /show-records/marc_records_scriblio_net/part28.dat:54457670:1176?format=raw |
LEADER: 01176cam 2200277 a 4500
001 99200343
003 DLC
005 20000606144543.0
008 990108s1998 waua b 101 0 eng d
010 $a 99200343
020 $a0819429031
035 $a(OCoLC)40591650
040 $aMoKL$cMoKL$dOCoLC$dTxU$dDLC
042 $alccopycat
050 00 $aQD941$b.C79 1998
082 00 $a548/.9$221
245 00 $aCrystal and multilayer optics :$b21-22 July, 1998, San Diego, California /$cAlbert T. Macrander ... [et al.], chairs/editors ; sponsored and published by SPIE--The International Society for Optical Engineering.
260 $aBellingham, Wash. :$bSPIE,$cc1998.
300 $axii, 376 p. :$bill. ;$c28 cm.
490 1 $aProceedings / SPIE--the International Society for Optical Engineering ;$vv. 3448
504 $aIncludes bibliographical references and author index.
650 0 $aCrystal optics$vCongresses.
650 0 $aThin films, Multilayered$xOptical properties$vCongresses.
700 1 $aMacrander, A. T.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3448.