| Record ID | marc_uic/UIC_2022.mrc:214609533:1858 |
| Source | marc_uic |
| Download Link | /show-records/marc_uic/UIC_2022.mrc:214609533:1858?format=raw |
LEADER: 01858cam a2200481 4500
001 998070512005897
005 20200409171250.0
008 731017s1973 nyua b 001 0 eng
010 $a73076960
020 $a0844802093
020 $a9780844802091
035 $a917581-01carli_network
035 $a(OCoLC)ocm00737243
035 $a(EIUdb)218557
035 $a(EXLNZ-01CARLI_NETWORK)991045741189705816
040 $aDLC$beng$cDLC$dOCLCQ$dMUQ$dBTCTA$dOCLCG$dBDX$dOCLCO$dOCLCF$dOCLCQ$dOCLCO$dEIUdb
049 $aIADA
050 00 $aQC176.8.O6$bT68
082 00 $a621.319/37
100 1 $aTownsend, P. D.$q(Peter David)
245 10 $aColour centres and imperfections in insulators and semiconductors$c[by] P.D. Townsend [and] J.C. Kelly.
260 $aNew York,$bCrane, Russak$c[1973]
300 $ax, 229 pages$billustrations$c23 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
338 $avolume$bnc$2rdacarrier
504 $aIncludes bibliographical references.
530 $aAlso issued online.
650 0 $aColor centers.
650 0 $aElectric insulators and insulation$xDefects.
650 0 $aSemiconductors$xDefects.
650 6 $aCentres colorés.
650 6 $aIsolation électrique$xDéfauts.
650 6 $aSemiconducteurs$xDéfauts.
650 7 $aColor centers.$2fast$0(OCoLC)fst00868538
650 7 $aElectric insulators and insulation$xDefects.$2fast$0(OCoLC)fst00904976
650 7 $aSemiconductors$xDefects.$2fast$0(OCoLC)fst01112211
700 1 $aKelly, J. C.$q(John Clive),$eauthor.
776 08 $iOnline version:$aTownsend, P.D. (Peter David).$tColour centres and imperfections in insulators and semiconductors.$dNew York, Crane, Russak [1973]$w(OCoLC)595088843
959 $a(EIUdb)218557
959 $a(UICdb)80705$9LOCAL
994 $a92$bIAD
976 $a38198000266625