| Record ID | marc_university_of_toronto/uoft.marc:1029753588:1285 |
| Source | University of Toronto |
| Download Link | /show-records/marc_university_of_toronto/uoft.marc:1029753588:1285?format=raw |
LEADER: 01285cam 2200277 a 4500
005 19970717093757.6
008 970717s1996 paua b 101 0 eng d
020 $a1558993312
050 04 $aTK7874$b.M3442 1996
090 8 $aTK 7874 .M3442 1996X$bENGI$c1
245 00 $aMaterials reliability in microelectronics VI :$bsymposium held April 8-12, 1996, San Francisco, California, U.S.A. /$ceditors, William F. Filter ... [et al.].
246 3 $aMaterials reliability in microelectronics six
246 3 $aMaterials reliability in microelectronics 6
260 $aPittsburgh, Pa. :$bMaterials Research Society,$cc1996.
300 $axv, 583 p. :$bill. ;$c24 cm.
490 1 $aMaterials Research Society symposium proceedings ;$vv. 428
504 $aIncludes bibliographical references and indexes.
650 0 $aMicroelectronics$xReliability$xCongresses.
650 0 $aMicroelectronics$xMaterials$xTesting$xCongresses.
650 0 $aMicrostructure$xCongresses.
650 0 $aMetallizing$xCongresses.
700 1 $aFilter, William F.
830 0 $aMaterials Research Society symposia proceedings ;$vv. 428.
948 $a07/17/1997$b07/17/1999
039 $fut/ut(ut)
949 $aTK7874 .M3442 1996X$wLC$c1$i31761044179810$d3/12/2002$e24/11/2002$lSTACKS$mENGI_CSCI$n3$q2$rY$sY$tBOOK$u27/7/1997