| Record ID | marc_university_of_toronto/uoft.marc:1222569730:1550 |
| Source | University of Toronto |
| Download Link | /show-records/marc_university_of_toronto/uoft.marc:1222569730:1550?format=raw |
LEADER: 01550cam 2200373 a 4500
005 19971107121059.2
008 971107s1996 onca b f000 0 eng d
020 $a0660167026
039 $fes/es(es)
041 0 $aeng$bengfre
050 4 $aTA418.9.T45$bK43 1996
086 1 $aCC2-11275E
090 8 $aTA 418.9 .T45K43 1996$bENGI$c1
100 1 $aKhatamian, Djamshid
245 10 $aCrystal structure of thin oxide films grown on Zr-Nb alloys studied by RHEED /$cby D. Khatamian and S.D. Lalonde.
246 1 $iParallel title on cover in French:$aStructure cristalline de fines pellicules d'oxyde formées sur des alliages Zr-Nb étudiés par la technique RHEED
260 $aChalk River, Ont. :$bReactor Materials Research Branch, Chalk River Laboratories,$c1996.
300 $a13 p. :$bill. ;$c28 cm.
490 1 $aAECL,$x0067-0367 ;$v11275
500 $a"June 1996."--Cover.
500 $aAt head of cover title: AECL = EACL.
500 $a"COG-95-77-1."
500 $a"CC2-11275E"
504 $aIncludes bibliographical references (p. 5-6).
546 $aAbstract in English and French.
650 0 $aOxide coating.
650 0 $aReflection high energy electron diffraction.
650 0 $aThin films.
700 1 $aLalonde, S. D.
710 2 $aAtomic Energy of Canada Limited.
710 2 $aChalk River Laboratories.$bReactor Materials Research Branch.
830 0 $aAECL research (Series) ;$v11275
948 $a11/07/1997$b07/17/1999
949 $aTA418.9 .T45 K43 1996$wLC$c1$i31761044199149$lSTACKS$mENGI_CSCI$rY$sY$tBOOK$u27/11/1997