| Record ID | marc_university_of_toronto/uoft.marc:2325766529:512 |
| Source | University of Toronto |
| Download Link | /show-records/marc_university_of_toronto/uoft.marc:2325766529:512?format=raw |
LEADER: 00512cam 22001570 4500
008 700701s1970 ||| eng x
050 4 $aTN690$bT56
090 8 $aTN 690 .T56$bENGI$c1
100 10 $aTolansky, Samuel
245 10 $aMultiple-beam interference microscopy of metals.
260 0 $aLondon$bAcademic Press$c1970
300 $a147p.
650 0 $aInterference microscopes.
650 0 $aMetallography
948 $a07/14/1992$b09/20/1998
949 $aTN690 .T56$wLC$c1$i31761003526688$lOFFSITE$mENGI_CSCI$rY$sY$tBOOK$u26/8/1992