| Record ID | marc_university_of_toronto/uoft.marc:3705593007:810 |
| Source | University of Toronto |
| Download Link | /show-records/marc_university_of_toronto/uoft.marc:3705593007:810?format=raw |
LEADER: 00810cam 22001810i 4500
008 801029s1977 nyu 1 eng x
046 $aOME$beng
090 8 $aQH 212 .S3G64$bERI
100 10 $aGoldstein, Joseph,$d1939-
245 10 $aPractical scanning electron microscopy :$belectron and ion microprobe analysis, edited by Joseph I. Goldstein and Harvey Yakowitz; forword by T.E. Everhart.
260 0 $aNew York,$bPlenum Press$c[1977, c1975]
300 $axviii, 582 p. ill. ;$c24 cm.
500 $aIncludes bibliographical references and index.
650 0 $aScanning electron microscope
650 0 $aMicroprobe analysis
700 10 $aYakowitz, H., jt. author
948 $a07/15/1992$b11/06/1999
949 $aQH212 .S3 G64$wLC$c1$i31761024158206$d18/1/2008$e18/1/2008$kCHECKEDOUT$lSTACKS$mUTM$n24$q13$rM$sY$tBOOK$u26/8/1992