| Record ID | marc_university_of_toronto/uoft.marc:4496082292:760 |
| Source | University of Toronto |
| Download Link | /show-records/marc_university_of_toronto/uoft.marc:4496082292:760?format=raw |
LEADER: 00760cam 22001817a 4500
001 vABX-8989
008 030417s2003 us |||||||||||||||||eng d
020 $a030647350X
037 $bCoutts;20018323;04/17/03$c0145.00
050 4 $aQC
100 1 $aOrloff, Jon.
245 10 $aHigh resolution focused ion beams :$bFIB and its applications ; the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology /$cJon Orloff, Mark Utlaut, and Lynwood Swanson.
250 $a
260 $aNew York, NY :$bKluwer Academic/Plenum Publishers,$cc2003.
300 $ax, 303 p. :
929 $a150114
929 $a04-17-03$b014500$d000847$e012955$f20018323
949 $aCO-DSO48-75021$wASIS$c1$i4966520-1001$lVENDOR$mCOLL_DEV$rY$sY$tBOOK$u19/9/2003