| Record ID | marc_university_of_toronto/uoft.marc:4577885706:729 |
| Source | University of Toronto |
| Download Link | /show-records/marc_university_of_toronto/uoft.marc:4577885706:729?format=raw |
LEADER: 00729nam 22001577a 4500
001 v0218035
008 031231s2004 us |||||||||||||||||eng d
020 $a0819450634
037 $bCoutts;20021575;12/31/03$c0105.00
050 4 $aQC
245 00 $aRecent developments in traceable dimensional measurements II :$b4-6 August 2003, San Diego, California, USA /$cJennifer E. Decker, Nicholas Brown, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
260 $aBellingham, WA :$bSPIE,$cc2003.
300 $axi, 478 p. :$bill. ;$c28 cm.
980 $a12-31-03$b010500$d000614$e009382$f20021575
981 $a218035
949 $aCO-DSO-111459$wASIS$c1$i5065183-1001$lVENDOR$mCOLL_DEV$rY$sY$tBOOK$u12/1/2004