| Record ID | marc_university_of_toronto/uoft.marc:5575371404:621 |
| Source | University of Toronto |
| Download Link | /show-records/marc_university_of_toronto/uoft.marc:5575371404:621?format=raw |
LEADER: 00621nam 22001457a 4500
001 a6227339
008 071015s2008 us |||||||||||||||||eng d
020 $a9789812569080
050 4 $aTK
245 00 $aImage pattern recognition :$bsynthesis and analysis in biometrics /$ceditors, Svetlana N. Yanushkevich ... [et al.] ; consulting editor, Mark S. Nixon.
260 $aSingapore :$bWorld Scientific,$cc2007.
300 $axxi, 430 p. :$bill. ;$c24 cm.
037 $bCoutts;20050770;10/15/07$c0093.00
037 $a 101507 009300 000466 008232 20050770
949 $aCO-DSO48-314963$wASIS$c1$i6227339-1001$lVENDOR$mCOLL_DEV$rY$sY$tBOOK$u18/10/2007