Record ID | marc_upei/marc-for-openlibrary-bigset.mrc:25744935:810 |
Source | University of Prince Edward Island |
Download Link | /show-records/marc_upei/marc-for-openlibrary-bigset.mrc:25744935:810?format=raw |
LEADER: 00810cam a2200205 i 4500
008 750102s1975 nyua 00110 eng
020 $a03063082
035 7 $a(Sirsi) AAD-1
090 97 $aQH212.S3G64$i3734800031
100 11 $aGoldstein, Joseph,$d
245 93 $aPractical scanning electron microscopy :$belectron and ion microprobe analysis /$cedited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Eve
260 ha $aNew York :$bPlenum Press,
300 [1 $axviii, 582 p. :$bill. ;
504 c2 $aIncludes bibliographical references a
650 d $aScanning electron mi
650 ro $aMicroprob
700 a $aYakowitz, Ha
948 ve $d1939- $a02/08/199
949 $b09/12/2001 $aQH212.S3G64$wLC
901 mU $zNOITEM $a30435