| Record ID | marc_western_washington_univ/wwu_bibs.mrc_revrev.mrc:582381123:1248 |
| Source | Western Washington University |
| Download Link | /show-records/marc_western_washington_univ/wwu_bibs.mrc_revrev.mrc:582381123:1248?format=raw |
LEADER: 01248nam 22003257a 4500
001 ocm29323050
003 OCoLC
005 19931115095028.0
008 931115s1987 dcu b f000 0 eng d
035 $a(GPO)94067282
040 $aGPO$cGPO$dDLC$dMvI
049 $aXFFA
086 0 $aC 13.58:87-3074
245 00 $aMetrology for electromagnetic technology$h[microform] :$ba bibliography of NBS publications /$cedited by Kathryn E. Kline, Mary E. DeWeese-Bishop
260 $a[Washington, D.C.] :$bU.S. Dept. of Commerce, National Bureau of Standards ;$a[Springfield, VA. :$bOrder from National Technical Information Service,$c1987]
300 $a1 v
490 1 $aNBSIR ;$v87-3074
500 $aDistributed to depository libraries in microfiche
500 $aShipping list no.: 92-0606-M
533 $aMicrofiche.$b[Washington, D.C.?] :$cSupt. of Docs., U.S. G.P.O.,$d[1991]$e1 microfiche
650 0 $aElectromagnetic measurements$xBibliography
650 0 $aCryoelectronics$xBibliography
700 10 $aKline, K. E
700 10 $aDeWeese, Mary E
710 10 $aUnited States.$bNational Bureau of Standards
830 0 $aNBSIR ;$v3074
907 $a.b17749311$bdc $c-
902 $a071014
998 $b1$c970910$dm$ea$f-$g0
902 $aMarcive