| Record ID | talis_openlibrary_contribution/talis-openlibrary-contribution.mrc:937375797:586 |
| Source | Talis |
| Download Link | /show-records/talis_openlibrary_contribution/talis-openlibrary-contribution.mrc:937375797:586?format=raw |
LEADER: 00586cam a2200157 a 4500
001 79ea4024d9d0477192a8450d3be2c6e0
003 UK-BiTAL
005 20050705132046.0
008 000411s1995 xxu | 000 ||eng|d
020 $a1559374977
035 $a()1559374977
040 $aUP$cUP$dUK-BiTAL
100 1 $aIEEE Computer Society,$dTest Technology Standards Committee.
245 00 $aSupplement to IEE Std 1149.1-1990, IEEE standard test access port and boundary-scan architecture.
260 $aNew York :$bInstitute of Electrical and Electronics Engineers, Inc.,$cc1995.
500 $aIEEE Std 1149.1b-1994.