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Last edited by Alan Millar
July 25, 2012 | History
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Publish Date
1990
Publisher
U.S. Dept. of Commerce, National Institute of Standards and Technology,
Order from National Technical Information Service
Language
English
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Subjects
Scanning systems, Laser beamsShowing 1 featured edition. View all 1 editions?
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Scanning system for measuring uniformity of laser detector response and laser beam dimensions
1990, U.S. Dept. of Commerce, National Institute of Standards and Technology, Order from National Technical Information Service
Microform
in English
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Book Details
Edition Notes
Distributed to depository libraries in microfiche
Shipping list no.: 92-1152-M
Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 2 microfiches
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Feedback?July 25, 2012 | Edited by Alan Millar | merge authors |
January 16, 2010 | Edited by WorkBot | add subjects and covers |
December 11, 2009 | Created by WorkBot | add works page |